In-situ Electron Microscopy: Applications in Physics, Chemistry and Materials Science

Adopting a didactical approach from fundamentals to actual experiments and applications, this handbook and ready reference covers
real-time observations using modern scanning electron microscopy and transmission electron microscopy, while also providing information
on the required stages and samples. The text begins with introductory material and the basics, before describing advancements and applications in dynamic transmission electron microscopy and reflection electron microscopy. Subsequently, the techniques needed to determine growth processes, chemical reactions and oxidation, irradiation effects, mechanical, magnetic, and ferroelectric properties as well as cathodoluminiscence and electromigration are discussed.

Keywords: focused ion beam workstations, FIB, scanning electron microscopes, SEM, and transmission electron microscopes, TEM, nanostructure, material properties, material parameters