Friedbacher, Gernot
Surface and Thin Film Analysis: A Compendium of Principles, Instrumentation, and Applications
Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry.
From a Review of the First Edition (edited by Bubert and Jenett)
"... a useful resource..."
(Journal of the American Chemical Society)
From a Review of the First Edition (edited by Bubert and Jenett)
"... a useful resource..."
(Journal of the American Chemical Society)
Keywords: surface, practical, techniques relevant, applications, guide, topic, bestseller, edition, technology, nano, second, hot, vital, book, new, electron, parts, four, microscopy, probe, techniques, snom, chapters, frequency, equipment, reference
- Editor
- Friedbacher, Gernot
- Bubert, Henning
- Publisher
- John Wiley and Sons, Inc.
- Publication year
- 2011
- Language
- en
- Edition
- 2
- Page amount
- 558 pages
- Category
- Technology, Energy, Traffic
- Format
- Ebook
- eISBN (ePUB)
- 9783527636938
- Printed ISBN
- 9783527636945