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Amelinckx, S.

Electron Microscopy: Principles and Fundamentals

Amelinckx, S. - Electron Microscopy: Principles and Fundamentals, ebook

211,20€

Ebook, PDF with Adobe DRM
ISBN: 9783527614554
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Printing158 pages with an additional page accrued every 5 hours, capped at 158 pages
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Derived from the successful three-volume Handbook of Microscopy, this book provides a broad survey of the physical fundamentals and principles of all modern techniques of electron microscopy. This reference work on the method most often used for the characterization of surfaces offers a competent comparison of the feasibilities of the latest developments in this field of research.

Topics include:
* Stationary Beam Methods: Transmission Electron Microscopy/ Electron Energy Loss Spectroscopy/ Convergent Electron Beam Diffraction/ Low Energy Electron Microscopy/ Electron Holographic Methods
* Scanning Beam Methods: Scanning Transmission Electron Microscopy/ Scanning Auger and XPS Microscopy/ Scanning Microanalysis/ Imaging Secondary Ion Mass Spectrometry
* Magnetic Microscopy: Scanning Electron Microscopy with Polarization Analysis/ Spin Polarized Low Energy Electron Microscopy

Materials scientists as well as any surface scientist will find this book an invaluable source of information for the principles of electron microscopy.

Keywords: Microscopy

Author(s)
 
 
 
Publisher
John Wiley and Sons, Inc.
Publication year
2008
Language
en
Edition
1
Page amount
527 pages
Category
Technology, Energy, Traffic
Format
Ebook
eISBN (PDF)
9783527614554
Printed ISBN
9783527294794

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