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Birkholz, Mario

Thin Film Analysis by X-Ray Scattering

Birkholz, Mario - Thin Film Analysis by X-Ray Scattering, ebook

111,40€

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ISBN: 9783527607044
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With contributions by Paul F. Fewster and Christoph Genzel

While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films. Very much an interdisciplinary field, chemists, biochemists, materials scientists, physicists and engineers all have a common interest in thin films and their manifold uses and applications.
Grain size, porosity, density, preferred orientation and other properties are important to know: whether thin films fulfill their intended function depends crucially on their structure and morphology once a chemical composition has been chosen. Although their backgrounds differ greatly, all the involved specialists a profound understanding of how structural properties may be determined in order to perform their respective tasks in search of new and modern materials, coatings and functions. The author undertakes this in-depth introduction to the field of thin film X-ray characterization in a clear and precise manner.

Keywords: Materials Characterization

Author(s)
Publisher
John Wiley and Sons, Inc.
Publication year
2006
Language
en
Edition
1
Page amount
378 pages
Category
Technology, Energy, Traffic
Format
Ebook
eISBN (PDF)
9783527607044
Printed ISBN
9783527310524

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