## Goebel, Ernst O.

# Quantum Metrology: Foundation of Units and Measurements

The International System of Units (SI) is the world's most widely used system of measurement, used every day in commerce and science, and is the modern form of the metric system. It currently comprises the meter (m), the kilogram (kg), the second (s), the ampere (A), the kelvin (K), the candela (cd) and the mole (mol)). The system is changing though, units and unit definitions are modified through international agreements as the technology of measurement progresses, and as the precision of measurements improves. The SI is now being redefined based on constants of nature and their realization by quantum standards. Therefore, the underlying physics and technologies will receive increasing interest, and not only in the metrology community but in all fields of science.

This book introduces and explains the applications of modern physics concepts to metrology, the science and the applications of measurements. A special focus is made on the use of quantum standards for the realization of the forthcoming new SI (the international system of units). The basic physical phenomena are introduced on a level which provides comprehensive information for the experienced reader but also provides a guide for a more intense study of these phenomena for students.

This book introduces and explains the applications of modern physics concepts to metrology, the science and the applications of measurements. A special focus is made on the use of quantum standards for the realization of the forthcoming new SI (the international system of units). The basic physical phenomena are introduced on a level which provides comprehensive information for the experienced reader but also provides a guide for a more intense study of these phenomena for students.

**Keywords:** measurement technology SI system physics nanotechnology nanometrology, measurement technology SI system physics nanotechnology nanometrology, measurement technology SI system physics nanotechnology nanometrology, measurement technology SI system physics nanotechnology nanometrology, measurement technology SI system physics nanotechnology nanometrology, Quantum Physics & Field Theory

- Author(s)
- Goebel, Ernst O.
- Siegner, Uwe
- Publisher
- John Wiley and Sons, Inc.
- Publication year
- 2015
- Language
- de
- Edition
- 1
- Page amount
- 400 pages
- Category
- Natural Sciences
- Format
- Ebook
- eISBN (ePUB)
- 9783527680924
- Printed ISBN
- 9783527412655