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Ohlídal, Miloslav

Optical Characterization of Thin Solid Films

Ohlídal, Miloslav - Optical Characterization of Thin Solid Films, ebook

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ISBN: 9783319753256
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Table of contents

Part I. Introduction and Modelling

1. Introduction
O. Stenzel, Miloslav Ohlídal

2. Characterization of Porous Zirconia Samples as an Example of the Interplay Between Optical and Non-optical Characterization Methods
O. Stenzel

3. Universal Dispersion Model for Characterization of Thin Films Over Wide Spectral Range
Daniel Franta, Jiří Vohánka, Martin Čermák

4. Predicting Optical Properties from Ab Initio Calculations
Pavel Ondračka, David Holec, Lenka Zajíčková

Part II. Spectrophotometry and Spectral Ellipsometry

5. Optical Characterization of Thin Films by Means of Imaging Spectroscopic Reflectometry
Miloslav Ohlídal, Jiří Vodák, David Nečas

6. Data Processing Methods for Imaging Spectrophotometry
David Nečas

7. In Situ and Ex Situ Spectrophotometric Characterization of Single- and Multilayer-Coatings I: Basics
Olaf Stenzel, Steffen Wilbrandt

8. In Situ and Ex Situ Spectrophotometric Characterization of Single- and Multilayer-Coatings II: Experimental Technique and Application Examples
Steffen Wilbrandt, Olaf Stenzel

9. Ellipsometry of Layered Systems
Ivan Ohlídal, Jiří Vohánka, Martin Čermák, Daniel Franta

Part III. Characterization of Defective and Corrugated Coatings

10. Optical Characterization of Thin Films Exhibiting Defects
Ivan Ohlídal, Martin Čermák, Jiří Vohánka

11. Scanning Probe Microscopy Characterization of Optical Thin Films
Petr Klapetek

12. Resonant Waveguide Grating Structures
Stefanie Kroker, Thomas Siefke

13. Polarization Control by Deep Ultra Violet Wire Grid Polarizers
Thomas Siefke, Stefanie Kroker

Part IV. Scatter and Absorption

14. Roughness and Scatter in Optical Coatings
M. Trost, S. Schröder

15. Absorption and Fluorescence Measurements in Optical Coatings
Christian Mühlig

16. Cavity Ring-Down Technique for Optical Coating Characterization
Christian Karras

Keywords: Physics, Surface and Interface Science, Thin Films, Optical and Electronic Materials, Spectroscopy and Microscopy, Characterization and Evaluation of Materials, Surfaces and Interfaces, Thin Films

Editor
 
Publisher
Springer
Publication year
2018
Language
en
Edition
1
Series
Springer Series in Surface Sciences
Page amount
24 pages
Category
Natural Sciences
Format
Ebook
eISBN (PDF)
9783319753256
Printed ISBN
978-3-319-75324-9

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