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Sayil, Selahattin

Contactless VLSI Measurement and Testing Techniques

Sayil, Selahattin - Contactless VLSI Measurement and Testing Techniques, ebook

118,40€

Ebook, PDF with Adobe DRM
ISBN: 9783319696737
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Table of contents

1. Conventional Test Methods
Selahattin Sayil

2. Testability Design
Selahattin Sayil

3. Other Techniques Based on the Contacting Probe
Selahattin Sayil

4. Contactless Testing
Selahattin Sayil

5. Electron Beam and Photoemission Probing
Selahattin Sayil

6. Electro-Optic Sampling and Charge-Density Probe
Selahattin Sayil

7. Electric Force Microscope, Capacitive Coupling, and Scanning Magnetoresistive Probe
Selahattin Sayil

8. Probing Techniques Based on Light Emission from Chip
Selahattin Sayil

9. All-Silicon Optical Technology for Contactless Testing of Integrated Circuits
Selahattin Sayil

10. Comparison of Contactless Testing Methodologies
Selahattin Sayil

Keywords: Engineering, Circuits and Systems, Processor Architectures, Electronics and Microelectronics, Instrumentation

Author(s)
Publisher
Springer
Publication year
2018
Language
en
Edition
1
Category
Technology, Energy, Traffic
Format
Ebook
eISBN (PDF)
9783319696737
Printed ISBN
978-3-319-69672-0

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