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Freeman, Yuri

Tantalum and Niobium-Based Capacitors

Freeman, Yuri - Tantalum and Niobium-Based Capacitors, ebook

118,40€

Ebook, PDF with Adobe DRM
ISBN: 9783319678702
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Table of contents

1. Major Degradation Mechanisms
Yuri Freeman

2. Basic Technology
Yuri Freeman

3. Applications
Yuri Freeman

4. Conclusion
Yuri Freeman

Keywords: Engineering, Circuits and Systems, Electronic Circuits and Devices, Electronics and Microelectronics, Instrumentation

Author(s)
Publisher
Springer
Publication year
2018
Language
en
Edition
1
Category
Technology, Energy, Traffic
Format
Ebook
eISBN (PDF)
9783319678702
Printed ISBN
978-3-319-67869-6

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