Freeman, Yuri
Tantalum and Niobium-Based Capacitors
Table of contents
1. Major Degradation Mechanisms
Yuri Freeman
2. Basic Technology
Yuri Freeman
3. Applications
Yuri Freeman
4. Conclusion
Yuri Freeman
Keywords: Engineering, Circuits and Systems, Electronic Circuits and Devices, Electronics and Microelectronics, Instrumentation
- Author(s)
- Freeman, Yuri
- Publisher
- Springer
- Publication year
- 2018
- Language
- en
- Edition
- 1
- Page amount
- 19 pages
- Category
- Technology, Energy, Traffic
- Format
- Ebook
- eISBN (PDF)
- 9783319678702
- Printed ISBN
- 978-3-319-67869-6
