Chakrabarty, Krishnendu
Testing of Interposer-Based 2.5D Integrated Circuits
Table of contents
1. Introduction
Ran Wang, Krishnendu Chakrabarty
2. Pre-bond Testing of the Silicon Interposer
Ran Wang, Krishnendu Chakrabarty
3. Post-bond Scan-Based Testing of Interposer Interconnects
Ran Wang, Krishnendu Chakrabarty
4. Test Architecture and Test-Path Scheduling
Ran Wang, Krishnendu Chakrabarty
5. Built-In Self-Test
Ran Wang, Krishnendu Chakrabarty
6. ExTest Scheduling and Optimization
Ran Wang, Krishnendu Chakrabarty
7. A Programmable Method for Low-Power Scan Shift in SoC Dies
Ran Wang, Krishnendu Chakrabarty
8. Conclusions
Ran Wang, Krishnendu Chakrabarty
Keywords: Engineering, Circuits and Systems, Processor Architectures, Logic Design
- Author(s)
- Chakrabarty, Krishnendu
- Wang, Ran
- Publisher
- Springer
- Publication year
- 2017
- Language
- en
- Edition
- 1
- Category
- Technology, Energy, Traffic
- Format
- Ebook
- eISBN (PDF)
- 9783319547145
- Printed ISBN
- 978-3-319-54713-8
