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Chakrabarty, Krishnendu

Testing of Interposer-Based 2.5D Integrated Circuits

Chakrabarty, Krishnendu - Testing of Interposer-Based 2.5D Integrated Circuits, ebook

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ISBN: 9783319547145
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Table of contents

1. Introduction
Ran Wang, Krishnendu Chakrabarty

2. Pre-bond Testing of the Silicon Interposer
Ran Wang, Krishnendu Chakrabarty

3. Post-bond Scan-Based Testing of Interposer Interconnects
Ran Wang, Krishnendu Chakrabarty

4. Test Architecture and Test-Path Scheduling
Ran Wang, Krishnendu Chakrabarty

5. Built-In Self-Test
Ran Wang, Krishnendu Chakrabarty

6. ExTest Scheduling and Optimization
Ran Wang, Krishnendu Chakrabarty

7. A Programmable Method for Low-Power Scan Shift in SoC Dies
Ran Wang, Krishnendu Chakrabarty

8. Conclusions
Ran Wang, Krishnendu Chakrabarty

Keywords: Engineering, Circuits and Systems, Processor Architectures, Logic Design

Author(s)
 
Publisher
Springer
Publication year
2017
Language
en
Edition
1
Category
Technology, Energy, Traffic
Format
Ebook
eISBN (PDF)
9783319547145
Printed ISBN
978-3-319-54713-8

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