Login

Borja, Juan Pablo

Dielectric Breakdown in Gigascale Electronics

Borja, Juan Pablo - Dielectric Breakdown in Gigascale Electronics, ebook

76,85€

Ebook, PDF with Adobe DRM
ISBN: 9783319432205
DRM Restrictions

PrintingNot allowed
Copy to clipboardNot allowed

Table of contents

1. Introduction
Juan Pablo Borja, Toh-Ming Lu, Joel Plawsky

2. General Theories
Juan Pablo Borja, Toh-Ming Lu, Joel Plawsky

3. Measurement Tools and Test Structures
Juan Pablo Borja, Toh-Ming Lu, Joel Plawsky

4. Experimental Techniques
Juan Pablo Borja, Toh-Ming Lu, Joel Plawsky

5. Breakdown Experiments
Juan Pablo Borja, Toh-Ming Lu, Joel Plawsky

6. Kinetics of Charge Carrier Confinement in Thin Dielectrics
Juan Pablo Borja, Toh-Ming Lu, Joel Plawsky

7. Theory of Dielectric Breakdown in Nano-Porous Thin Films
Juan Pablo Borja, Toh-Ming Lu, Joel Plawsky

8. Dielectric Breakdown in Copper Interconnects
Juan Pablo Borja, Toh-Ming Lu, Joel Plawsky

9. Reconsidering Conventional Field Acceleration Models
Juan Pablo Borja, Toh-Ming Lu, Joel Plawsky

Keywords: Materials Science, Optical and Electronic Materials, Nanotechnology and Microengineering, Electronic Circuits and Devices, Nanotechnology

Author(s)
 
 
Publisher
Springer
Publication year
2016
Language
en
Edition
1
Series
SpringerBriefs in Materials
Category
Technology, Energy, Traffic
Format
Ebook
eISBN (PDF)
9783319432205
Printed ISBN
978-3-319-43218-2

Similar titles