Celano, Umberto
Metrology and Physical Mechanisms in New Generation Ionic Devices
Table of contents
1. Introduction
Umberto Celano
2. Filamentary-Based Resistive Switching
Umberto Celano
3. Nanoscaled Electrical Characterization
Umberto Celano
4. Conductive Filaments: Formation, Observation and Manipulation
Umberto Celano
5. Three-Dimensional Filament Observation
Umberto Celano
6. Reliability Threats in CBRAM
Umberto Celano
7. Conclusions and Outlook
Umberto Celano
Keywords: Physics, Spectroscopy and Microscopy, Nanotechnology and Microengineering, Characterization and Evaluation of Materials
- Author(s)
- Celano, Umberto
- Publisher
- Springer
- Publication year
- 2016
- Language
- en
- Edition
- 1
- Series
- Springer Theses
- Page amount
- 24 pages
- Category
- Natural Sciences
- Format
- Ebook
- eISBN (PDF)
- 9783319395319
- Printed ISBN
- 978-3-319-39530-2
