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Celano, Umberto

Metrology and Physical Mechanisms in New Generation Ionic Devices

Celano, Umberto - Metrology and Physical Mechanisms in New Generation Ionic Devices, ebook

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ISBN: 9783319395319
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Table of contents

1. Introduction
Umberto Celano

2. Filamentary-Based Resistive Switching
Umberto Celano

3. Nanoscaled Electrical Characterization
Umberto Celano

4. Conductive Filaments: Formation, Observation and Manipulation
Umberto Celano

5. Three-Dimensional Filament Observation
Umberto Celano

6. Reliability Threats in CBRAM
Umberto Celano

7. Conclusions and Outlook
Umberto Celano

Keywords: Physics, Spectroscopy and Microscopy, Nanotechnology and Microengineering, Characterization and Evaluation of Materials

Author(s)
Publisher
Springer
Publication year
2016
Language
en
Edition
1
Series
Springer Theses
Page amount
24 pages
Category
Natural Sciences
Format
Ebook
eISBN (PDF)
9783319395319
Printed ISBN
978-3-319-39530-2

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