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Liu, Xiao

Trace-Based Post-Silicon Validation for VLSI Circuits

Liu, Xiao - Trace-Based Post-Silicon Validation for VLSI Circuits, ebook

132,70€

Ebook, PDF with Adobe DRM
ISBN: 9783319005331
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Table of contents

1. Introduction
Xiao Liu, Qiang Xu

2. State of the Art on Post-Silicon Validation
Xiao Liu, Qiang Xu

3. Signal Selection for Visibility Enhancement
Xiao Liu, Qiang Xu

4. Multiplexed Tracing for Design Error
Xiao Liu, Qiang Xu

5. Tracing for Electrical Error
Xiao Liu, Qiang Xu

6. Reusing Test Access Mechanisms
Xiao Liu, Qiang Xu

7. Interconnection Fabric for Flexible Tracing
Xiao Liu, Qiang Xu

8. Interconnection Fabric for Systematic Tracing
Xiao Liu, Qiang Xu

9. Conclusion
Xiao Liu, Qiang Xu

Keywords: Engineering, Circuits and Systems, Processor Architectures, Semiconductors

Author(s)
 
Publisher
Springer
Publication year
2014
Language
en
Edition
2014
Series
Lecture Notes in Electrical Engineering
Category
Technology, Energy, Traffic
Format
Ebook
eISBN (PDF)
9783319005331

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