Liu, Xiao
Trace-Based Post-Silicon Validation for VLSI Circuits
Table of contents
1. Introduction
Xiao Liu, Qiang Xu
2. State of the Art on Post-Silicon Validation
Xiao Liu, Qiang Xu
3. Signal Selection for Visibility Enhancement
Xiao Liu, Qiang Xu
4. Multiplexed Tracing for Design Error
Xiao Liu, Qiang Xu
5. Tracing for Electrical Error
Xiao Liu, Qiang Xu
6. Reusing Test Access Mechanisms
Xiao Liu, Qiang Xu
7. Interconnection Fabric for Flexible Tracing
Xiao Liu, Qiang Xu
8. Interconnection Fabric for Systematic Tracing
Xiao Liu, Qiang Xu
9. Conclusion
Xiao Liu, Qiang Xu
Keywords: Engineering, Circuits and Systems, Processor Architectures, Semiconductors
- Author(s)
- Liu, Xiao
- Xu, Qiang
- Publisher
- Springer
- Publication year
- 2014
- Language
- en
- Edition
- 2014
- Series
- Lecture Notes in Electrical Engineering
- Page amount
- 15 pages
- Category
- Technology, Energy, Traffic
- Format
- Ebook
- eISBN (PDF)
- 9783319005331
