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Dahoo, Pierre Richard

Nanometer-scale Defect Detection Using Polarized Light

Dahoo, Pierre Richard - Nanometer-scale Defect Detection Using Polarized Light, ebook

129,45€

Ebook, ePUB with Adobe DRM
ISBN: 9781119329688
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This book describes experimental and theoretical methods that are implemented within the framework of fundamental research to better understand physical and chemical processes at the nanoscale that are responsible for the remarkable properties of materials used in innovative technological devices. It presents optical techniques based on polarized light allowing the characterization of defects in materials or in their interfaces that are likely to impact performance. It also describes ways of knowing mechanical properties of nanomaterials by using theoretical models and analysis of experimental results and their uncertainties.

Keywords: Nanophysics

Author(s)
 
 
Publisher
John Wiley and Sons, Inc.
Publication year
2016
Language
en
Edition
1
Page amount
316 pages
Category
Technology, Energy, Traffic
Format
Ebook
eISBN (ePUB)
9781119329688
Printed ISBN
9781848219366

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