Chateigner, Daniel
Combined Analysis
This book introduces and details the key facets of Combined Analysis - an x-ray and/or neutron scattering methodology which combines structural, textural, stress, microstructural, phase, layer, or other relevant variable or property analyses in a single approach. The text starts with basic theories related to diffraction by polycrystals and some of the most common combined analysis instrumental set-ups are detailed. Also discussed are microstructures of powder diffraction profiles; quantitative phase analysis from the Rietveld analysis; residual stress analysis for isotropic and anisotropic materials; specular x-ray reflectivity, and the various associated models.
Keywords: introduction; notions; diffraction; powder; basic; braggs; conditions; geometric; diffraction line; main; components; peaks; thickness; rietveld; refinement; diffraction profile; method; principle; factors, Combinatorics, Combinatorics
- Author(s)
- Chateigner, Daniel
- Publisher
- John Wiley and Sons, Inc.
- Publication year
- 2010
- Language
- en
- Edition
- 1
- Series
- ISTE
- Page amount
- 496 pages
- Category
- Technology, Energy, Traffic
- Format
- Ebook
- eISBN (ePUB)
- 9781118622643
- Printed ISBN
- 9781848211988