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Ueda, Osamu

Materials and Reliability Handbook for Semiconductor Optical and Electron Devices

Ueda, Osamu - Materials and Reliability Handbook for Semiconductor Optical and Electron Devices, ebook

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ISBN: 9781461443377
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Table of contents

1. Reliability Testing of Semiconductor Optical Devices
Mitsuo Fukuda

2. Failure Analysis of Semiconductor Optical Devices
Osamu Ueda, Robert W. Herrick

3. Failure Analysis Using Optical Evaluation Technique (OBIC) of LDs and APDs for Fiber Optical Communication
Tatsuya Takeshita

4. Reliability and Degradation of III-V Optical Devices Focusing on Gradual Degradation
Osamu Ueda

5. Catastrophic Optical Damage in High-Power, Broad-Area Laser Diodes
Aland K. Chin, Rick K. Bertaska

6. Reliability and Degradation of Vertical-Cavity Surface-Emitting Lasers
Robert W. Herrick

7. Structural Defects in GaN-Based Materials and Their Relation to GaN-Based Laser Diodes
Shigetaka Tomiya

8. InGaN Laser Diode Degradation
Piotr Perlin, Łucja Marona

9. Radiation-Enhanced Dislocation Glide: The Current Status of Research
Koji Maeda

10. Mechanism of Defect Reactions in Semiconductors
Yuzo Shinozuka

11. Reliability Studies in the Real World
William J. Roesch

12. Strain Effects in AlGaN/GaN HEMTs
Min Chu, Andrew D. Koehler, Amit Gupta, Srivatsan Parthasarathy, Mehmet Onur Baykan, Scott E. Thompson, Toshikazu Nishida

13. Reliability Issues in AlGaN/GaN High Electron Mobility Transistors
E. A. Douglas, L. Liu, C. F. Lo, B. P. Gila, F. Ren, Stephen J. Pearton

14. GaAs Device Reliability: High Electron Mobility Transistors and Heterojunction Bipolar Transistors
F. Ren, E. A. Douglas, Stephen J. Pearton

15. Novel Dielectrics for GaN Device Passivation and Improved Reliability
F. Ren, Stephen J. Pearton, B. P. Gila, C. R. Abernathy, R. C. Fitch

16. Reliability Simulation
M. E. Law, M. Griglione, E. Patrick, N. Rowsey, D. Horton

17. The Analysis of Wide Band Gap Semiconductors Using Raman Spectroscopy
Sukwon Choi, Eric Heller, Don Dorsey, Samuel Graham

18. Reliability Study of InP-Based HBTs Operating at High Current Density
Yoshino K. Fukai, Kenji Kurishima

Keywords: Physics, Optics, Optoelectronics, Plasmonics and Optical Devices, Optical and Electronic Materials, Electronics and Microelectronics, Instrumentation, Electronic Circuits and Devices, Characterization and Evaluation of Materials, Laser Technology, Photonics

Author(s)
 
Publisher
Springer
Publication year
2013
Language
en
Edition
2013
Category
Natural Sciences
Format
Ebook
eISBN (PDF)
9781461443377

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