Modeling Nanoscale Imaging in Electron Microscopy

1. Kantianism at the Nano-scale
Michael Dickson

2. The Application of Scanning Transmission Electron Microscopy (STEM) to the Study of Nanoscale Systems
N. D. Browning, J. P. Buban, M. Chi, B. Gipson, M. Herrera, D. J. Masiel, S. Mehraeen, D. G. Morgan, N. L. Okamoto, Q. M. Ramasse, B. W. Reed, H. Stahlberg

3. High Resolution ExitWave Restoration
Sarah J. Haigh, Angus I. Kirkland

4. Compressed Sensing and Electron Microscopy
Peter Binev, Wolfgang Dahmen, Ronald DeVore, Philipp Lamby, Daniel Savu, Robert Sharpley

5. High-Quality Image Formation by Nonlocal Means Applied to High-Angle Annular Dark-Field Scanning Transmission Electron Microscopy (HAADF–STEM)
Peter Binev, Francisco Blanco-Silva, Douglas Blom, Wolfgang Dahmen, Philipp Lamby, Robert Sharpley, Thomas Vogt

6. Center of Mass Operators for Cryo-EM—Theory and Implementation
Amit Singer, Yoel Shkolnisky

Keywords: Materials Science, Characterization and Evaluation of Materials, Analytical Chemistry, Nanotechnology, Theoretical and Computational Chemistry, Measurement Science and Instrumentation