Login

Vogt, Thomas

Modeling Nanoscale Imaging in Electron Microscopy

Vogt, Thomas - Modeling Nanoscale Imaging in Electron Microscopy, ebook

132,70€

Ebook, PDF with Adobe DRM
ISBN: 9781461421917
DRM Restrictions

PrintingNot allowed
Copy to clipboardNot allowed

Table of contents

1. Kantianism at the Nano-scale
Michael Dickson

2. The Application of Scanning Transmission Electron Microscopy (STEM) to the Study of Nanoscale Systems
N. D. Browning, J. P. Buban, M. Chi, B. Gipson, M. Herrera, D. J. Masiel, S. Mehraeen, D. G. Morgan, N. L. Okamoto, Q. M. Ramasse, B. W. Reed, H. Stahlberg

3. High Resolution ExitWave Restoration
Sarah J. Haigh, Angus I. Kirkland

4. Compressed Sensing and Electron Microscopy
Peter Binev, Wolfgang Dahmen, Ronald DeVore, Philipp Lamby, Daniel Savu, Robert Sharpley

5. High-Quality Image Formation by Nonlocal Means Applied to High-Angle Annular Dark-Field Scanning Transmission Electron Microscopy (HAADF–STEM)
Peter Binev, Francisco Blanco-Silva, Douglas Blom, Wolfgang Dahmen, Philipp Lamby, Robert Sharpley, Thomas Vogt

6. Center of Mass Operators for Cryo-EM—Theory and Implementation
Amit Singer, Yoel Shkolnisky

Keywords: Materials Science, Characterization and Evaluation of Materials, Analytical Chemistry, Nanotechnology, Theoretical and Computational Chemistry, Measurement Science and Instrumentation

Author(s)
 
 
Publisher
Springer
Publication year
2012
Language
en
Edition
2012
Series
Nanostructure Science and Technology
Category
Technology, Energy, Traffic
Format
Ebook
eISBN (PDF)
9781461421917

Similar titles