Egerton, R.F.
Electron Energy-Loss Spectroscopy in the Electron Microscope
1. An Introduction to EELS
R.F. Egerton
2. Energy-Loss Instrumentation
R.F. Egerton
3. Physics of Electron Scattering
R.F. Egerton
4. Quantitative Analysis of Energy-Loss Data
R.F. Egerton
5. TEM Applications of EELS
R.F. Egerton
6. Bethe Theory for High Incident Energies and Anisotropic Materials
R.F. Egerton
7. Computer Programs
R.F. Egerton
8. Plasmon Energies and Inelastic Mean Free Paths
R.F. Egerton
9. Inner-Shell Energies and Edge Shapes
R.F. Egerton
10. Electron Wavelengths, Relativistic Factors, and Physical Constants
R.F. Egerton
11. Options for Energy-Loss Data Acquisition
R.F. Egerton
Keywords: Materials Science, Characterization and Evaluation of Materials, Solid State Physics, Spectroscopy and Microscopy, Spectroscopy/Spectrometry, Nanotechnology
- Author(s)
- Egerton, R.F.
- Publisher
- Springer
- Publication year
- 2011
- Language
- en
- Edition
- 1
- Page amount
- 12 pages
- Category
- Technology, Energy, Traffic
- Format
- Ebook
- eISBN (PDF)
- 9781441995834