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Egerton, R.F.

Electron Energy-Loss Spectroscopy in the Electron Microscope

Egerton, R.F. - Electron Energy-Loss Spectroscopy in the Electron Microscope, ebook

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ISBN: 9781441995834
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Table of contents

1. An Introduction to EELS
R.F. Egerton

2. Energy-Loss Instrumentation
R.F. Egerton

3. Physics of Electron Scattering
R.F. Egerton

4. Quantitative Analysis of Energy-Loss Data
R.F. Egerton

5. TEM Applications of EELS
R.F. Egerton

6. Bethe Theory for High Incident Energies and Anisotropic Materials
R.F. Egerton

7. Computer Programs
R.F. Egerton

8. Plasmon Energies and Inelastic Mean Free Paths
R.F. Egerton

9. Inner-Shell Energies and Edge Shapes
R.F. Egerton

10. Electron Wavelengths, Relativistic Factors, and Physical Constants
R.F. Egerton

11. Options for Energy-Loss Data Acquisition
R.F. Egerton

Keywords: Materials Science, Characterization and Evaluation of Materials, Solid State Physics, Spectroscopy and Microscopy, Spectroscopy/Spectrometry, Nanotechnology

Author(s)
Publisher
Springer
Publication year
2011
Language
en
Edition
1
Category
Technology, Energy, Traffic
Format
Ebook
eISBN (PDF)
9781441995834

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