Bhushan, Manjul
Microelectronic Test Structures for CMOS Technology
Table of contents
1. Introduction
Manjul Bhushan, Mark B. Ketchen
2. Test Structure Basics
Manjul Bhushan, Mark B. Ketchen
3. Resistors
Manjul Bhushan, Mark B. Ketchen
4. Capacitors
Manjul Bhushan, Mark B. Ketchen
5. MOSFETs
Manjul Bhushan, Mark B. Ketchen
6. Ring Oscillators
Manjul Bhushan, Mark B. Ketchen
7. High-Speed Characterization
Manjul Bhushan, Mark B. Ketchen
8. Test Structures for SOI Technology
Manjul Bhushan, Mark B. Ketchen
9. Test Equipment and Measurements
Manjul Bhushan, Mark B. Ketchen
10. Data Analysis
Manjul Bhushan, Mark B. Ketchen
Keywords: Engineering, Electronics and Microelectronics, Instrumentation, Optical and Electronic Materials, Circuits and Systems
- Author(s)
- Bhushan, Manjul
- Ketchen, Mark B.
- Publisher
- Springer
- Publication year
- 2011
- Language
- en
- Edition
- 1
- Page amount
- 34 pages
- Category
- Technology, Energy, Traffic
- Format
- Ebook
- eISBN (PDF)
- 9781441993779
