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Kalinin, Sergei V.

Scanning Probe Microscopy of Functional Materials

Kalinin, Sergei V. - Scanning Probe Microscopy of Functional Materials, ebook

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ISBN: 9781441971678
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Table of contents

1. Excitation and Mechanisms of Single Molecule Reactions in Scanning Tunneling Microscopy
Peter Maksymovych

2. High-Resolution Architecture and Structural Dynamics of Microbial and Cellular Systems: Insights from in Vitro Atomic Force Microscopy
Alexander J. Malkin, Marco Plomp

3. Dynamic Force Microscopy and Spectroscopy in Ambient Conditions: Theory and Applications
Hendrik Hölscher, Jan-Erik Schmutz, Udo D. Schwarz

4. Measuring Mechanical Properties on the Nanoscale with Contact Resonance Force Microscopy Methods
D. C. Hurley

5. Multi-Frequency Atomic Force Microscopy
Roger Proksch

6. Dynamic Nanomechanical Characterization Using Multiple-Frequency Method
Ozgur Sahin

7. Toward Nanoscale Chemical Imaging: The Intersection of Scanning Probe Microscopy and Mass Spectrometry
Olga S. Ovchinnikova

8. Dynamic SPM Methods for Local Analysis of Thermo-Mechanical Properties
M. P. Nikiforov, Roger Proksch

9. Advancing Characterization of Materials with Atomic Force Microscopy-Based Electric Techniques
Sergei Magonov, John Alexander, Shijie Wu

10. Quantitative Piezoresponse Force Microscopy: Calibrated Experiments, Analytical Theory and Finite Element Modeling
Lili Tian, Vasudeva Rao Aravind, Venkatraman Gopalan

11. High-Speed Piezo Force Microscopy: Novel Observations of Ferroelectric Domain Poling, Nucleation, and Growth
Bryan D. Huey, Ramesh Nath

12. Polar Structures in Relaxors by Piezoresponse Force Microscopy
V. V. Shvartsman, W. Kleemann, D. A. Kiselev, I. K. Bdikin, A. L. Kholkin

13. Symmetries in Piezoresponse Force Microscopy
Andreas Ruediger

14. New Capabilities at the Interface of X-Rays and Scanning Tunneling Microscopy
Volker Rose, John W. Freeland, Stephen K. Streiffer

15. Scanning Ion Conductance Microscopy
Johannes Rheinlaender, Tilman E. Schäffer

16. Combined Voltage-Clamp and Atomic Force Microscope for the Study of Membrane Electromechanics
Arthur Beyder, Frederick Sachs

17. Dynamic and Spectroscopic Modes and Multivariate Data Analysis in Piezoresponse Force Microscopy
B. J. Rodriguez, S. Jesse, K. Seal, N. Balke, S. V. Kalinin, Roger Proksch

18. Polarization Behavior in Thin Film Ferroelectric Capacitors at the Nanoscale
A. Gruverman

Keywords: Materials Science, Characterization and Evaluation of Materials

Author(s)
 
Publisher
Springer
Publication year
2011
Language
en
Edition
1
Category
Technology, Energy, Traffic
Format
Ebook
eISBN (PDF)
9781441971678

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