Kalinin, Sergei V.
Scanning Probe Microscopy of Functional Materials
1. Excitation and Mechanisms of Single Molecule Reactions in Scanning Tunneling Microscopy
Peter Maksymovych
2. High-Resolution Architecture and Structural Dynamics of Microbial and Cellular Systems: Insights from in Vitro Atomic Force Microscopy
Alexander J. Malkin, Marco Plomp
3. Dynamic Force Microscopy and Spectroscopy in Ambient Conditions: Theory and Applications
Hendrik Hölscher, Jan-Erik Schmutz, Udo D. Schwarz
4. Measuring Mechanical Properties on the Nanoscale with Contact Resonance Force Microscopy Methods
D. C. Hurley
5. Multi-Frequency Atomic Force Microscopy
Roger Proksch
6. Dynamic Nanomechanical Characterization Using Multiple-Frequency Method
Ozgur Sahin
7. Toward Nanoscale Chemical Imaging: The Intersection of Scanning Probe Microscopy and Mass Spectrometry
Olga S. Ovchinnikova
8. Dynamic SPM Methods for Local Analysis of Thermo-Mechanical Properties
M. P. Nikiforov, Roger Proksch
9. Advancing Characterization of Materials with Atomic Force Microscopy-Based Electric Techniques
Sergei Magonov, John Alexander, Shijie Wu
10. Quantitative Piezoresponse Force Microscopy: Calibrated Experiments, Analytical Theory and Finite Element Modeling
Lili Tian, Vasudeva Rao Aravind, Venkatraman Gopalan
11. High-Speed Piezo Force Microscopy: Novel Observations of Ferroelectric Domain Poling, Nucleation, and Growth
Bryan D. Huey, Ramesh Nath
12. Polar Structures in Relaxors by Piezoresponse Force Microscopy
V. V. Shvartsman, W. Kleemann, D. A. Kiselev, I. K. Bdikin, A. L. Kholkin
13. Symmetries in Piezoresponse Force Microscopy
Andreas Ruediger
14. New Capabilities at the Interface of X-Rays and Scanning Tunneling Microscopy
Volker Rose, John W. Freeland, Stephen K. Streiffer
15. Scanning Ion Conductance Microscopy
Johannes Rheinlaender, Tilman E. Schäffer
16. Combined Voltage-Clamp and Atomic Force Microscope for the Study of Membrane Electromechanics
Arthur Beyder, Frederick Sachs
17. Dynamic and Spectroscopic Modes and Multivariate Data Analysis in Piezoresponse Force Microscopy
B. J. Rodriguez, S. Jesse, K. Seal, N. Balke, S. V. Kalinin, Roger Proksch
18. Polarization Behavior in Thin Film Ferroelectric Capacitors at the Nanoscale
A. Gruverman
Keywords: Materials Science, Characterization and Evaluation of Materials
- Author(s)
- Kalinin, Sergei V.
- Gruverman, Alexei
- Publisher
- Springer
- Publication year
- 2011
- Language
- en
- Edition
- 1
- Page amount
- 18 pages
- Category
- Technology, Energy, Traffic
- Format
- Ebook
- eISBN (PDF)
- 9781441971678