Kanekawa, Nobuyasu
Dependability in Electronic Systems
Table of contents
1. Introduction
Nobuyasu Kanekawa, Eishi H. Ibe, Takashi Suga, Yutaka Uematsu
2. Terrestrial Neutron-Induced Failures in Semiconductor Devices and Relevant Systems and Their Mitigation Techniques
Nobuyasu Kanekawa, Eishi H. Ibe, Takashi Suga, Yutaka Uematsu
3. Electromagnetic Compatibility
Nobuyasu Kanekawa, Eishi H. Ibe, Takashi Suga, Yutaka Uematsu
4. Power Integrity
Nobuyasu Kanekawa, Eishi H. Ibe, Takashi Suga, Yutaka Uematsu
5. Fault-Tolerant System Technology
Nobuyasu Kanekawa, Eishi H. Ibe, Takashi Suga, Yutaka Uematsu
6. Challenges in the Future
Nobuyasu Kanekawa, Eishi H. Ibe, Takashi Suga, Yutaka Uematsu
Keywords: Engineering, Circuits and Systems, Computer-Aided Engineering (CAD, CAE) and Design
- Author(s)
- Kanekawa, Nobuyasu
- Ibe, Eishi H.
- Suga, Takashi
- Uematsu, Yutaka
- Publisher
- Springer
- Publication year
- 2011
- Language
- en
- Edition
- 1
- Page amount
- 25 pages
- Category
- Technology, Energy, Traffic
- Format
- Ebook
- eISBN (PDF)
- 9781441967152
