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Kanekawa, Nobuyasu

Dependability in Electronic Systems

Kanekawa, Nobuyasu - Dependability in Electronic Systems, ebook

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Ebook, PDF with Adobe DRM
ISBN: 9781441967152
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Table of contents

1. Introduction
Nobuyasu Kanekawa, Eishi H. Ibe, Takashi Suga, Yutaka Uematsu

2. Terrestrial Neutron-Induced Failures in Semiconductor Devices and Relevant Systems and Their Mitigation Techniques
Nobuyasu Kanekawa, Eishi H. Ibe, Takashi Suga, Yutaka Uematsu

3. Electromagnetic Compatibility
Nobuyasu Kanekawa, Eishi H. Ibe, Takashi Suga, Yutaka Uematsu

4. Power Integrity
Nobuyasu Kanekawa, Eishi H. Ibe, Takashi Suga, Yutaka Uematsu

5. Fault-Tolerant System Technology
Nobuyasu Kanekawa, Eishi H. Ibe, Takashi Suga, Yutaka Uematsu

6. Challenges in the Future
Nobuyasu Kanekawa, Eishi H. Ibe, Takashi Suga, Yutaka Uematsu

Keywords: Engineering, Circuits and Systems, Computer-Aided Engineering (CAD, CAE) and Design

Author(s)
 
 
 
Publisher
Springer
Publication year
2011
Language
en
Edition
1
Page amount
25 pages
Category
Technology, Energy, Traffic
Format
Ebook
eISBN (PDF)
9781441967152

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