Singhee, Amith
Extreme Statistics in Nanoscale Memory Design
Table of contents
1. Introduction
Amith Singhee
2. Extreme Statistics in Memories
Amith Singhee
3. Statistical Nano CMOS Variability and Its Impact on SRAM
Asen Asenov
4. Importance Sampling-Based Estimation: Applications to Memory Design
Rouwaida Kanj, Rajiv Joshi
5. Direct SRAM Operation Margin Computation with Random Skews of Device Characteristics
Robert C. Wong
6. Yield Estimation by Computing Probabilistic Hypervolumes
Chenjie Gu, Jaijeet Roychowdhury
7. Most Probable Point-Based Methods
Xiaoping Du, Wei Chen, Yu Wang
8. Extreme Value Theory: Application to Memory Statistics
Robert C. Aitken, Amith Singhee, Rob A. Rutenbar
Keywords: Engineering, Circuits and Systems, Electronics and Microelectronics, Instrumentation
- Author(s)
- Singhee, Amith
- Rutenbar, Rob A.
- Publisher
- Springer
- Publication year
- 2010
- Language
- en
- Edition
- 1
- Imprint
- Springer US - Boston, MA
- Series
- Integrated Circuits and Systems
- Page amount
- 9 pages
- Category
- Technology, Energy, Traffic
- Format
- Ebook
- eISBN (PDF)
- 9781441966063
