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Kirkland, Earl J.

Advanced Computing in Electron Microscopy

Kirkland, Earl J. - Advanced Computing in Electron Microscopy, ebook

124,00€

Ebook, PDF with Adobe DRM
ISBN: 9781441965332
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Table of contents

1. Introduction
Earl J. Kirkland

2. The Transmission Electron Microscope
Earl J. Kirkland

3. Linear Image Approximations
Earl J. Kirkland

4. Sampling and the Fast Fourier Transform
Earl J. Kirkland

5. Calculation of Images of Thin Specimens
Earl J. Kirkland

6. Theory of Calculation of Images of Thick Specimens
Earl J. Kirkland

7. Multislice Applications and Examples
Earl J. Kirkland

8. The Programs
Earl J. Kirkland

9. Plotting Transfer Functions
Earl J. Kirkland

10. The Fourier Projection Theorem
Earl J. Kirkland

11. Atomic Potentials and Scattering Factors
Earl J. Kirkland

12. Bilinear Interpolation
Earl J. Kirkland

13. 3D Perspective View
Earl J. Kirkland

Keywords: Materials Science, Characterization and Evaluation of Materials, Electrical Engineering

Author(s)
Publisher
Springer
Publication year
2010
Language
en
Edition
1
Category
Technology, Energy, Traffic
Format
Ebook
eISBN (PDF)
9781441965332

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