Liu, Johan
Reliability of Microtechnology
1. Introduction to Reliability and Its Importance
Johan Liu, Olli Salmela, Jussi Särkkä, James E. Morris, Per-Erik Tegehall, Cristina Andersson
2. Reliability Metrology
Johan Liu, Olli Salmela, Jussi Särkkä, James E. Morris, Per-Erik Tegehall, Cristina Andersson
3. General Failure Mechanisms of Microsystems
Johan Liu, Olli Salmela, Jussi Särkkä, James E. Morris, Per-Erik Tegehall, Cristina Andersson
4. Solder Joint Reliability
Johan Liu, Olli Salmela, Jussi Särkkä, James E. Morris, Per-Erik Tegehall, Cristina Andersson
5. Conductive Adhesive Joint Reliability
Johan Liu, Olli Salmela, Jussi Särkkä, James E. Morris, Per-Erik Tegehall, Cristina Andersson
6. Accelerated Testing
Johan Liu, Olli Salmela, Jussi Särkkä, James E. Morris, Per-Erik Tegehall, Cristina Andersson
7. Reliability Design for Manufacturability
Johan Liu, Olli Salmela, Jussi Särkkä, James E. Morris, Per-Erik Tegehall, Cristina Andersson
8. Component Reliability
Johan Liu, Olli Salmela, Jussi Särkkä, James E. Morris, Per-Erik Tegehall, Cristina Andersson
9. System Level Reliability
Johan Liu, Olli Salmela, Jussi Särkkä, James E. Morris, Per-Erik Tegehall, Cristina Andersson
10. Reliability and Quality Management of Microsystem
Johan Liu, Olli Salmela, Jussi Särkkä, James E. Morris, Per-Erik Tegehall, Cristina Andersson
11. Experimental Tools for Reliability Analysis
Johan Liu, Olli Salmela, Jussi Särkkä, James E. Morris, Per-Erik Tegehall, Cristina Andersson
Keywords: Engineering, Electronics and Microelectronics, Instrumentation, Optical and Electronic Materials, Quality Control, Reliability, Safety and Risk, Nanotechnology and Microengineering
- Author(s)
- Liu, Johan
- Salmela, Olli
- Sarkka, Jussi
- Morris, James E.
- Tegehall, Per-Erik
- Andersson, Cristina
- Publisher
- Springer
- Publication year
- 2011
- Language
- en
- Edition
- 1
- Page amount
- 13 pages
- Category
- Technology, Energy, Traffic
- Format
- Ebook
- eISBN (PDF)
- 9781441957603