Login

Bosio, Alberto

Advanced Test Methods for SRAMs

Bosio, Alberto - Advanced Test Methods for SRAMs, ebook

28,90€

Ebook, PDF with Adobe DRM
ISBN: 9781441909381
DRM Restrictions

PrintingNot allowed
Copy to clipboardNot allowed

Table of contents

1. Basics on SRAM Testing
Patrick Girard, Alberto Bosio, Luigi Dilillo, Serge Pravossoudovitch, Arnaud Virazel

2. Resistive-Open Defects in Core-Cells
Patrick Girard, Alberto Bosio, Luigi Dilillo, Serge Pravossoudovitch, Arnaud Virazel

3. Resistive-Open Defects in Pre-charge Circuits
Patrick Girard, Alberto Bosio, Luigi Dilillo, Serge Pravossoudovitch, Arnaud Virazel

4. Resistive-Open Defects in Address Decoders
Patrick Girard, Alberto Bosio, Luigi Dilillo, Serge Pravossoudovitch, Arnaud Virazel

5. Resistive-Open Defects in Write Drivers
Patrick Girard, Alberto Bosio, Luigi Dilillo, Serge Pravossoudovitch, Arnaud Virazel

6. Resistive-Open Defects in Sense Amplifiers
Patrick Girard, Alberto Bosio, Luigi Dilillo, Serge Pravossoudovitch, Arnaud Virazel

7. Faults Due to Process Variations in SRAMs
Patrick Girard, Alberto Bosio, Luigi Dilillo, Serge Pravossoudovitch, Arnaud Virazel

8. Diagnosis and Design-for-Diagnosis
Patrick Girard, Alberto Bosio, Luigi Dilillo, Serge Pravossoudovitch, Arnaud Virazel

Keywords: Engineering, Circuits and Systems, Computer-Aided Engineering (CAD, CAE) and Design

Author(s)
 
 
 
 
Publisher
Springer
Publication year
2010
Language
en
Edition
1
Category
Technology, Energy, Traffic
Format
Ebook
eISBN (PDF)
9781441909381

Similar titles