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Girard, Patrick

Power-Aware Testing and Test Strategies for Low Power Devices

Girard, Patrick - Power-Aware Testing and Test Strategies for Low Power Devices, ebook

161,20€

Ebook, PDF with Adobe DRM
ISBN: 9781441909282
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Table of contents

1. Fundamentals of VLSI Testing
Laung-Terng Wang, Charles E. Stroud

2. Power Issues During Test
Sandip Kundu, Alodeep Sanyal

3. Low-Power Test Pattern Generation
Xiaoqing Wen, Seongmoon Wang

4. Power-Aware Design-for-Test
Hans-Joachim Wunderlich, Christian G. Zoellin

5. Power-Aware Test Data Compression and BIST
Sandeep Kumar Goel, Krishnendu Chakrabarty

6. Power-Aware System-Level Test Planning
Erik Larsson, C. P. Ravikumar

7. Low-Power Design Techniques and Test Implications
Kaushik Roy, Swarup Bhunia

8. Test Strategies for Multivoltage Designs
Saqib Khursheed, Bashir M. Al-Hashimi

9. Test Strategies for Gated Clock Designs
Brion Keller, Krishna Chakravadhanula

10. Test of Power Management Structures
Mark Kassab, Mohammad Tehranipoor

11. EDA Solution for Power-Aware Design-for-Test
Mokhtar Hirech

Keywords: Engineering, Circuits and Systems, Computer-Aided Engineering (CAD, CAE) and Design

Author(s)
 
 
Publisher
Springer
Publication year
2010
Language
en
Edition
1
Page amount
20 pages
Category
Technology, Energy, Traffic
Format
Ebook
eISBN (PDF)
9781441909282

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