Pavlov, Andrei
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
Table of contents
1. Introduction and Motivation
2. SRAM Circuit Design and Operation
3. SRAM Cell Stability: Definition, Modeling and Testing
4. Traditional SRAM Fault Models and Test Practices
5. Techniques for Detection of SRAM Cells with Stability Faults
6. Soft Errors in SRAMs: Sources, Mechanisms and Mitigation Techniques
DRM-restrictions
Printing: not available
Clipboard copying: not available
- Author(s)
- Pavlov, Andrei
- Sachdev, Manoj
- Publisher
- Springer
- Publication year
- 2008
- Language
- en
- Edition
- 1
- Category
- Technology, Energy, Traffic
- Format
- Ebook
- eISBN (PDF)
- 9781402083631
