FOUILLAT, PASCAL
Radiation Effects on Embedded Systems
1. Radiation Space Environment
Jean-Claude Boudenot
2. Radiation Effects in Microelectronics
R. D. Schrimpf
3. In-flight Anomalies on Electronic Devices
Robert Ecoffet
4. Multi-level Fault Effects Evaluation
L. Anghel, M. Rebaudengo, M. Sonza Reorda, M. Violante
5. Effects of Radiation on Analog and Mixed-Signal Circuits
Marcelo Lubaszewski, Tiago Balen, Erik Schuler, Luigi Carro, Jose Luis Huertas
6. Fundamentals of the Pulsed Laser Technique for Single-Event Upset Testing
Pascal Fouillat, Vincent Pouget, Dale McMorrow, Frédéric Darracq, Stephen Buchner, Dean LEWIS
7. Design Hardening Methodologies for ASICs
Federico Faccio
8. Fault Tolerance in Programmable Circuits
Fernanda Lima Kastensmidt, Ricardo Reis
9. Automatic Tools for Design Hardening
Celia López-Ongil, Luis Entrena, Mario García-Valderas, Marta Portela-García
10. Test Facilities for SEE and Dose Testing
S. Duzellier, G. Berger
11. Error Rate Prediction of Digital Architectures: Test Methodology and Tools
Raoul Velazco, Fabien Faure
12. Using the SEEM Software for Laser SET Testing and Analysis
Vincent Pouget, Pascal Fouillat, Dean Lewis
Keywords: Engineering, Circuits and Systems, Effects of Radiation/Radiation Protection, Electronic and Computer Engineering, Electronics and Microelectronics, Instrumentation, Nuclear Engineering
- Author(s)
- FOUILLAT, PASCAL
- REIS, RICARDO
- VELAZCO, RAOUL
- Publisher
- Springer
- Publication year
- 2007
- Language
- en
- Edition
- 1
- Page amount
- 277 pages
- Category
- Technology, Energy, Traffic
- Format
- Ebook
- eISBN (PDF)
- 9781402056468