Vilarinho, Paula Maria

Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials

Vilarinho, Paula Maria - Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials, ebook


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Table of contents

Part I. Fundamentals of Functional Materials

1. Functional Materials: Properties, Processing and Applications
P.M. Vilarinho

2. Scaling of Silicon-Based Devices to Submicron Dimensions
A.I. Kingon

3. Unsolved Problems in Ferroelectrics for Scanning Probe Microscopy
J.F. Scott

Part II. Fundamentals of Scanning Probe Techniques

4. Principles of Basic and Advanced Scanning Probe Microscopy
D.A. Bonnell, R. Shao

5. Nanoscale Probing of Physical and Chemical Functionality with Near-Field Optical Microscopy
L.M. Eng

6. Nanoscale Electronic Measurements of Semiconductors Using Kelvin Probe Force Microscopy
Y. Rosenwaks, R. Shikler

7. Expanding the Capabilities of the Scanning Tunneling Microscope
K.F. Kelly, Z.J. Donhauser, B.A. Mantooth, P.S. Weiss

8. Functions of NC-AFM on Atomic Scale
S. Morita, N. Oyabu, T. Nishimoto, R. Nishi, O. Custance, I. Yi, Y. Sugawara

Part III. Application of Scanning Techniques to Functional Materials

9. Scanning Probe Microscopy of Piezoelectric and Transport Phenomena in Electroceramic Materials
S.V. Kalinin, D.A. Bonnell

10. SFM-Based Methods for Ferroelectric Studies
A. Gruverman

11. Scanning Tunneling Spectroscopy
M. Morgenstern

12. Nanoinspection of Dielectric and Polarization Properties at Inner and Outer Interfaces in Functional Ferroelectric PZT Thin Films
L.M. Eng

13. Microscale Contact Charging on a Silicon Oxide
S. Morita, T. Uchihashi, K. Okamoto, M. Abe, Y. Sugawara

14. Constructive Nanolithography
S.R. Cohen, R. Maoz, J. Sagiv

15. Nanometer-Scale Electronics and Storage
K.F. Kelly, Z.J. Donhauser, P.A. Lewis, R.K. Smith, P.S. Weiss

Part IV. Contributed papers

16. Stm Tips Fabrication for Critical Dimension Measurements
A. Pasquini, G.B. Picotto, M. Pisani

17. Scanning Probe Microscopy Characterization of Ferroelectrics Domains and Domains Walls in KTiOPO4
C. Canalias, R. Clemens, J. Hellström, F. Laurell, J. Wittborn, H. Karlsson

18. Imaging Local Dielectric and Mechanical Responses with Dynamic Heterodyned Electrostatic Force Microscopy
D.R. Oliver, K.M. Cheng, A. PU, D.J. Thomson, G.E. Bridges

19. AFM Patterning of SrTiO3?? Thin Films and Device Applications
L. Pellegrino

20. Nanoscale Investigation of a Rayleigh Wave on LiNbO3
J. Yang, R. Koch

21. Scanning Capacitance Force Microscopy and Kelvin Probe Force Microscopy of Nanostructures Embedded in SiO2
G. Tallarida, S. Spiga, M. Fanciulli

22. Electrical Characterisation of III–V Buried Heterostructure Lasers by Scanning Capacitance Microscopy
O. Douheret, K. Maknys, S. Anand

23. Probing the Density of States of High Temperature Superconductors with Point Contact Tunneling Spectroscopy
L. Ozyuzer, J.F. Zasadzinski, N. Miyakawa, K.E. Gray

24. Annealing Influence on Co Ultrathin Film Morphology in MBE Grown Co/Au Bilayers
A. Wawro, L.T. Baczewski, P. Pankowski, P. Aleszkiewicz, M. Kisielewski, I. Sveklo, A. Maziewski

25. Correlation between the Surface Relief and Interfaces Structure of Fe/Cr Superlattices and Electromagnetic Waves Penetration
A. Rinkevich, L. Romashev, V. Ustinov

26. Magnetoresistance and Microstructure of Magnetic Thin Film Multilayers
J. Neamtu, M. Volmer

27. SPM Investigation of Thiolated Gold Nanoparticle Patterns Deposited on Different Self-Assembled Substrates
F. Sbrana, M.T. Parodi, D. Ricci, E. Zitti

28. AFM of Guanine Adsorbed on HOPG under Electrochemical Control
A.-M. Chiorcea, A.M. Oliveira Brett

29. Dynamics in Model Membranes and DNA-Membrane Complexes Using Temperature Controlled Atomic Force Microscopy
Z.V. Leonenko, D.T. Cramb

Keywords: Physics, Condensed Matter, Optical and Electronic Materials, Nanotechnology, Surfaces and Interfaces, Thin Films

Publication year
NATO Science Series II: Mathematics, Physics and Chemistry
Page amount
525 pages
Natural Sciences

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