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Bohlen, Alex von

Total-Reflection X-Ray Fluorescence Analysis and Related Methods

Bohlen, Alex von - Total-Reflection X-Ray Fluorescence Analysis and Related Methods, ebook

134,65€

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ISBN: 9781118988961
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Printing166 pages with an additional page accrued every 5 hours, capped at 166 pages
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Providing an accessible introduction into the use of Total-Reflection X-ray Fluorescence (TXRF) Analysis, both from a theoretical point of view and for practical applications, this new edition of Total-Reflection X-Ray Fluorescence Analysis is completely updated and enlarged to emphasize new methods and techniques. Written to enable students and scientists to evaluate the suitability of a TXRF method for their specific needs, the text provides an overview to the physical fundamentals and principles of Total-Reflection X-ray Fluorescence (TXRF) Analysis, explains instrumentation and setups, and describes applications in a great variety of disciplines.

Keywords: Spectroscopy, Total-Reflection X-Ray Fluorescence Analysis, Reinhold Klockenkamper, Silicon-drift detector with Peltier-cooling, simple wavelength-dispersive X-ray spectrometer, TXRF, EXAFS, XANES

Author(s)
 
Publisher
John Wiley and Sons, Inc.
Publication year
2015
Language
en
Edition
2
Series
Chemical Analysis: A Series of Monographs on Analytical Chemistry and Its Applications
Page amount
552 pages
Category
Natural Sciences
Format
Ebook
eISBN (ePUB)
9781118988961
Printed ISBN
9781118460276

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