This volume presents both theoretical and applied aspects of runs and scans, and illustrates their important role in reliability analysis through various applications from science and engineering. Runs and Scans with Applications presents new and exciting content in a systematic and cohesive way in a single comprehensive volume, complete with relevant approximations and explanations of some limit theorems.
The authors provide detailed discussions of both classical and current problems, such as:
* Sooner and later waiting time
* Consecutive systems
* Start-up demonstration testing in life-testing experiments
* Learning and memory models
* "Match" in genetic codes
Runs and Scans with Applications offers broad coverage of the subject in the context of reliability and life-testing settings and serves as an authoritative reference for students and professionals alike.
Keywords: Applied Probability & Statistics