Petersen, Edward
Single Event Effects in Aerospace
Keywords: Cross Sections; Heavy Ions; Rate Predictions; Semiconductor device radiation effects; Single event characterization; Single event charge collection; Single Event Effect (SEE); Single event mechanisms; Single event Modeling; Single event upset; Soft error rate; Soft errors; Space Environment, Semiconductors, Aeronautic & Aerospace Engineering, Semiconductors, Aeronautic & Aerospace Engineering
- Author(s)
- Petersen, Edward
- Publisher
- John Wiley and Sons, Inc.
- Publication year
- 2011
- Language
- en
- Edition
- 1
- Page amount
- 520 pages
- Category
- Technology, Energy, Traffic
- Format
- Ebook
- eISBN (ePUB)
- 9781118084311
- Printed ISBN
- 9780470767498