Login

Tan, Cher Ming

Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections

Tan, Cher Ming - Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections, ebook

135,30€

Ebook, PDF with Adobe DRM
ISBN: 9780857293107
DRM Restrictions

PrintingNot allowed
Copy to clipboardNot allowed

Table of contents

1. Introduction
Cher Ming Tan, Zhenghao Gan, Wei Li, Yuejin Hou

2. Development of Physics-Based Modeling for ULSI Interconnections Failure Mechanisms: Electromigration and Stress-Induced Voiding
Cher Ming Tan, Zhenghao Gan, Wei Li, Yuejin Hou

3. Introduction and General Theory of Finite Element Method
Cher Ming Tan, Zhenghao Gan, Wei Li, Yuejin Hou

4. Finite Element Method for Electromigration Study
Cher Ming Tan, Zhenghao Gan, Wei Li, Yuejin Hou

5. Finite Element Method for Stress-Induced Voiding
Cher Ming Tan, Zhenghao Gan, Wei Li, Yuejin Hou

6. Finite Element Method for Dielectric Reliability
Cher Ming Tan, Zhenghao Gan, Wei Li, Yuejin Hou

Keywords: Engineering, Quality Control, Reliability, Safety and Risk, Computational Intelligence, Electronics and Microelectronics, Instrumentation, Optical and Electronic Materials, Partial Differential Equations

Author(s)
 
 
 
Publisher
Springer
Publication year
2011
Language
en
Edition
1
Series
Springer Series in Reliability Engineering
Page amount
7 pages
Category
Technology, Energy, Traffic
Format
Ebook
eISBN (PDF)
9780857293107

Similar titles