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Leng, Yang

Materials Characterization: Introduction to Microscopic and Spectroscopic Methods

Leng, Yang - Materials Characterization: Introduction to Microscopic and Spectroscopic Methods, ebook

119,10€

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ISBN: 9780470822999
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This book covers state-of-the-art techniques commonly used in modern materials characterization. Two important aspects of characterization, materials structures and chemical analysis, are included. Widely used techniques, such as metallography (light microscopy), X-ray diffraction, transmission and scanning electron microscopy, are described. In addition, the book introduces advanced techniques, including scanning probe microscopy. The second half of the book accordingly presents techniques such as X-ray energy dispersive spectroscopy (commonly equipped in the scanning electron microscope), fluorescence X-ray spectroscopy, and popular surface analysis techniques (XPS and SIMS). Finally, vibrational spectroscopy (FTIR and Raman) and thermal analysis are also covered.

Author(s)
Publisher
John Wiley and Sons, Inc.
Publication year
2009
Language
en
Edition
1
Page amount
384 pages
Category
Technology, Energy, Traffic
Format
Ebook
eISBN (PDF)
9780470822999

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