Login

Aliev, Telman

Digital Noise Monitoring of Defect Origin

Aliev, Telman - Digital Noise Monitoring of Defect Origin, ebook

142,60€

Ebook, PDF with Adobe DRM
ISBN: 9780387717548
DRM Restrictions

PrintingNot allowed
Copy to clipboardNot allowed

Table of contents

1. Difficulties of Monitoring a Defect at Its Origin and Its Dataware Features
2. Position-Binary Technology of Monitoring Defect at its Origin
3. Technology of Digital Analysis of Noise as a Carrier of Information about the Beginning of a Defect's Origin
4. Robust Correlation Monitoring of a Defect at its Origin
5. Spectral Monitoring of a Defect's Origin
6. The Digital Technology of Forecasting Failures by Considering Noise as a Data Carrier
7. The Technology of Monitoring a Defect's Origin by Considering Noise as a Data Carrier

DRM-restrictions

Printing: not available
Clipboard copying: not available

Keywords: TECHNOLOGY & ENGINEERING / General TEC000000

Author(s)
Publisher
Springer
Publication year
2007
Language
en
Edition
1
Category
Technology, Energy, Traffic
Format
Ebook
eISBN (PDF)
9780387717548

Similar titles