Aliev, Telman
Digital Noise Monitoring of Defect Origin
1. Difficulties of Monitoring a Defect at Its Origin and Its Dataware Features
2. Position-Binary Technology of Monitoring Defect at its Origin
3. Technology of Digital Analysis of Noise as a Carrier of Information about the Beginning of a Defect's Origin
4. Robust Correlation Monitoring of a Defect at its Origin
5. Spectral Monitoring of a Defect's Origin
6. The Digital Technology of Forecasting Failures by Considering Noise as a Data Carrier
7. The Technology of Monitoring a Defect's Origin by Considering Noise as a Data Carrier
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- Author(s)
- Aliev, Telman
- Publisher
- Springer
- Publication year
- 2007
- Language
- en
- Edition
- 1
- Category
- Technology, Energy, Traffic
- Format
- Ebook
- eISBN (PDF)
- 9780387717548