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Zhou, Weilie

Scanning Microscopy for Nanotechnology

Zhou, Weilie - Scanning Microscopy for Nanotechnology, ebook

142,60€

Ebook, PDF with Adobe DRM
ISBN: 9780387396200
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Table of contents

1. Fundamentals of Scanning Electron Microscopy (SEM)
Weilie Zhou, Robert Apkarian, Zhong Lin Wang, David Joy

2. Backscattering Detector and EBSD in Nanomaterials Characterization
Tim Maitland, Scott Sitzman

3. X-ray Microanalysis in Nanomaterials
Robert Anderhalt

4. Low kV Scanning Electron Microscopy
M. David Frey

5. E-beam Nanolithography Integrated with Scanning Electron Microscope
Joe Nabity, Lesely Anglin Compbell, Mo Zhu, Weilie Zhou

6. Scanning Transmission Electron Microscopy for Nanostructure Characterization
S. J. Pennycook, A. R. Lupini, M. Varela, A. Borisevich, Y. Peng, M. P. Oxley, K. Benthem, M. F. Chisholm

7. Introduction to In-Situ Nanomanipulation for Nanomaterials Engineering
Rishi Gupta, Richard E. Stallcup

8. Applications of FIB and DualBeam for Nanofabrication
Brandon Leer, Lucille A. Giannuzzi, Paul Anzalone

9. Nanowires and Carbon Nanotubes
Jianye Li, Jie Liu

10. Photonic Crystals and Devices
Xudong Wang, Zhong Lin Wang

11. Nanoparticles and Colloidal Self-assembly
Gabriel Caruntu, Daniela Caruntu, Charles J. O'Connor

12. Nano-building Blocks Fabricated through Templates
Feng Li, John B. Wiley

13. One-dimensional Wurtzite Semiconducting Nanostructures
Pu Xian Gao, Zhong Lin Wang

14. Bio-inspired Nanomaterials
Peng Wang, Guobao Wei, Xiaohua Liu, Peter X. Ma

15. Cryo-Temperature Stages in Nanostructural Research
Robert P. Apkarian

Keywords: Chemistry, Nanotechnology, Characterization and Evaluation of Materials, Optical and Electronic Materials, Measurement Science, Instrumentation

Author(s)
 
Publisher
Springer
Publication year
2007
Language
en
Edition
1
Page amount
536 pages
Category
Natural Sciences
Format
Ebook
eISBN (PDF)
9780387396200

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