Sachdev, Manoj
Thermal and Power Management of Integrated Circuits
Table of contents
1. Introduction
2. Power, Junction Temperature, and Reliability
3. Burn-in as a Reliability Screening Test
4. Thermal and Electrothermal Modeling
5. Thermal Runaway and Thermal Management
6. Low Temperature CMOS Operation
DRM-restrictions
Printing: not available
Clipboard copying: not available
- Author(s)
- Sachdev, Manoj
- Vassighi, Arman
- Publisher
- Springer
- Publication year
- 2006
- Language
- en
- Edition
- 1
- Category
- Technology, Energy, Traffic
- Format
- Ebook
- eISBN (PDF)
- 9780387297491