Gruverman, Alexei

Scanning Probe Microscopy

Gruverman, Alexei - Scanning Probe Microscopy, ebook


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Table of contents

1. Introduction
S. V. Kalinin, A. Gruverman

Part I. SPM Techniques for Electrical Characterization

2. Scanning Tunneling Potentiometry: The Power of STM applied to Electrical Transport
A. P. Baddorf

3. Probing Semiconductor Technology and Devices with Scanning Spreading Resistance Microscopy
P. Eyben, W. Vandervorst, D. Alvarez, M. Xu, M. Fouchier

4. Scanning Capacitance Microscopy for Electrical Characterization of Semiconductors and Dielectrics
J. J. Kopanski

5. Principles of Kelvin Probe Force Microscopy
Th. Glatzel, M.Ch. Lux-Steiner, E. Strassburg, A. Boag, Y. Rosenwaks

6. Frequency-Dependent Transport Imaging by Scanning Probe Microscopy
Ryan O’Hayre, Minhwan Lee, Fritz B. Prinz, Sergei V. Kalinin

7. Review of Ferroelectric Domain Imaging by Piezoresponse Force Microscopy
A. L. Kholkin, S. V. Kalinin, A. Roelofs, A. Gruverman

8. Principles of Near-Field Microwave Microscopy
Steven M. Anlage, Vladimir V. Talanov, Andrew R. Schwartz

9. Electromagnetic Singularities and Resonances in Near-Field Optical Probes
Alexandre Bouhelier, Renaud Bachelot

10. Electrochemical SPM
T. J. Smith, K. J. Stevenson

11. Near-Field High-Frequency Probing
C. A. Paulson, D. W. Weide

Part II. Electrical and Electromechanical Imaging at the Limits of Resolution

12. Scanning Probe Microscopy on Low-Dimensional Electron Systems in III–V Semiconductors
Markus Morgenstern

13. Spin-Polarized Scanning Tunneling Microscopy
Wulf Wulfhekel, Uta Schlickum, Jürgen Kirschner

14. Scanning Probe Measurements of Electron Transport in Molecules
Kevin F. Kelly, Paul S. Weiss

15. Scanning Probe Microscopy of Individual Carbon Nanotube Quantum Devices
C. Staii, M. Radosavljevic, A. T. Johnson

16. Conductance AFM Measurements of Transport Through Nanotubes and Nanotube Networks
M. Stadermann, S. Washburn

17. Theory of Scanning Probe Microscopy
Vincent Meunier, Philippe Lambin

18. Multi-Probe Scanning Tunneling Microscopy
Shuji Hasegawa

19. Dynamic Force Microscopy and Spectroscopy in Vacuum
Udo D. Schwarz, Hendrik Hölscher

20. Scanning Tunneling Microscopy and Spectroscopy of Manganites
Christoph Renner, Henrik M. Rønnow

Part III. Electrical SPM Characterization of Materials and Devices

21. Scanning Voltage Microscopy
Scott B. Kuntze, Dayan Ban, Edward H. Sargent, St. John Dixon-Warren, J. Kenton White, Karin Hinzer

22. Electrical Scanning Probe Microscopy of Biomolecules on Surfaces and at Interfaces
Ida Lee, Elias Greenbaum

23. Electromechanical Behavior in Biological Systems at the Nanoscale
Alexei Gruverman, Brian J. Rodriguez, Sergei V. Kalinin

24. Scanning Capacitance Microscopy
C. Y. Nakakura, P. Tangyunyong, M. L. Anderson

25. Kelvin Probe Force Microscopy of Semiconductors
Y. Rosenwaks, S. Saraf, O. Tal, A. Schwarzman, Th. Glatzel, M. Ch. Lux-Steiner

26. Nanoscale Characterization of Electronic and Electrical Properties of III-Nitrides by Scanning Probe Microscopy
B. J. Rodriguez, A. Gruverman, R. J. Nemanich

27. Electron Flow Through Molecular Structures
Sidney R. Cohen

28. Electrical Characterization of Perovskite Nanostructures by SPM
K. Szot, B. Reichenberg, F. Peter, R. Waser, S. Tiedke

29. SPM Measurements of Electric Properties of Organic Molecules
Takao Ishida, Wataru Mizutani, Yasuhisa Naitoh, Hiroshi Tokumoto

30. High-Sensitivity Electric Force Microscopy of Organic Electronic Materials and Devices
William R. Silveira, Erik M. Muller, Tse Nga Ng, David Dunlap, John A. Marohn

Part IV. Electrical Nanofabrication

31. Electrical SPM-Based Nanofabrication Techniques
Nicola Naujoks, Patrick Mesquida, Andreas Stemmer

32. Fundamental Science and Lithographic Applications of Scanning Probe Oxidation
J. A. Dagata

33. UHV-STM Nanofabrication on Silicon
Peter M. Albrecht, Laura B. Ruppalt, Joseph W. Lyding

34. Ferroelectric Lithography
Dongbo Li, Dawn A. Bonnell

35. Patterned Self-Assembled Monolayers via Scanning Probe Lithography
James A. Williams, Matthew S. Lewis, Christopher B. Gorman

36. Resistive Probe Storage: Read/Write Mechanism
Seungbum Hong, Noyeol Park

Keywords: Chemistry, Characterization and Evaluation of Materials, Nanotechnology, Surfaces and Interfaces, Thin Films, Biological Microscopy, Mechanical Engineering, Solid State Physics and Spectroscopy

Publication year
Page amount
1000 pages
Natural Sciences

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