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Seebauer, Edmund G.

Charged Semiconductor Defects

Charged Semiconductor Defects

130,20€

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ISBN: 9781848820593
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Table of contents

1. Introduction

2. Fundamentals of Defect Ionization and Transport

3. Experimental and Computational Characterization

4. Trends in Charged Defect Behavior

5. Intrinsic Defects: Structure

6. Intrinsic Defects: Ionization Thermodynamics

7. Intrinsic Defects: Diffusion

8. Extrinsic Defects

Keywords: SCIENCE / Physics SCI055000

Author(s)
 
Publisher
Springer
Publication year
2009
Language
en
Edition
1
Category
Natural Sciences
Format
Ebook
eISBN (PDF)
9781848820593

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