Vilarinho, Paula Maria
Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials
Part I. Fundamentals of Functional Materials
1. Functional Materials: Properties, Processing and Applications
P.M. Vilarinho
2. Scaling of Silicon-Based Devices to Submicron Dimensions
A.I. Kingon
3. Unsolved Problems in Ferroelectrics for Scanning Probe Microscopy
J.F. Scott
Part II. Fundamentals of Scanning Probe Techniques
4. Principles of Basic and Advanced Scanning Probe Microscopy
D.A. Bonnell, R. Shao
5. Nanoscale Probing of Physical and Chemical Functionality with Near-Field Optical Microscopy
L.M. Eng
6. Nanoscale Electronic Measurements of Semiconductors Using Kelvin Probe Force Microscopy
Y. Rosenwaks, R. Shikler
7. Expanding the Capabilities of the Scanning Tunneling Microscope
K.F. Kelly, Z.J. Donhauser, B.A. Mantooth, P.S. Weiss
8. Functions of NC-AFM on Atomic Scale
S. Morita, N. Oyabu, T. Nishimoto, R. Nishi, O. Custance, I. Yi, Y. Sugawara
Part III. Application of Scanning Techniques to Functional Materials
9. Scanning Probe Microscopy of Piezoelectric and Transport Phenomena in Electroceramic Materials
S.V. Kalinin, D.A. Bonnell
10. SFM-Based Methods for Ferroelectric Studies
A. Gruverman
11. Scanning Tunneling Spectroscopy
M. Morgenstern
12. Nanoinspection of Dielectric and Polarization Properties at Inner and Outer Interfaces in Functional Ferroelectric PZT Thin Films
L.M. Eng
13. Microscale Contact Charging on a Silicon Oxide
S. Morita, T. Uchihashi, K. Okamoto, M. Abe, Y. Sugawara
14. Constructive Nanolithography
S.R. Cohen, R. Maoz, J. Sagiv
15. Nanometer-Scale Electronics and Storage
K.F. Kelly, Z.J. Donhauser, P.A. Lewis, R.K. Smith, P.S. Weiss
Part IV. Contributed papers
16. Stm Tips Fabrication for Critical Dimension Measurements
A. Pasquini, G.B. Picotto, M. Pisani
17. Scanning Probe Microscopy Characterization of Ferroelectrics Domains and Domains Walls in KTiOPO
C. Canalias, R. Clemens, J. Hellström, F. Laurell, J. Wittborn, H. Karlsson
18. Imaging Local Dielectric and Mechanical Responses with Dynamic Heterodyned Electrostatic Force Microscopy
D.R. Oliver, K.M. Cheng, A. PU, D.J. Thomson, G.E. Bridges
19. AFM Patterning of SrTiO
L. Pellegrino
20. Nanoscale Investigation of a Rayleigh Wave on LiNbO
J. Yang, R. Koch
21. Scanning Capacitance Force Microscopy and Kelvin Probe Force Microscopy of Nanostructures Embedded in SiO
G. Tallarida, S. Spiga, M. Fanciulli
22. Electrical Characterisation of III–V Buried Heterostructure Lasers by Scanning Capacitance Microscopy
O. Douheret, K. Maknys, S. Anand
23. Probing the Density of States of High Temperature Superconductors with Point Contact Tunneling Spectroscopy
L. Ozyuzer, J.F. Zasadzinski, N. Miyakawa, K.E. Gray
24. Annealing Influence on Co Ultrathin Film Morphology in MBE Grown Co/Au Bilayers
A. Wawro, L.T. Baczewski, P. Pankowski, P. Aleszkiewicz, M. Kisielewski, I. Sveklo, A. Maziewski
25. Correlation between the Surface Relief and Interfaces Structure of Fe/Cr Superlattices and Electromagnetic Waves Penetration
A. Rinkevich, L. Romashev, V. Ustinov
26. Magnetoresistance and Microstructure of Magnetic Thin Film Multilayers
J. Neamtu, M. Volmer
27. SPM Investigation of Thiolated Gold Nanoparticle Patterns Deposited on Different Self-Assembled Substrates
F. Sbrana, M.T. Parodi, D. Ricci, E. Zitti
28. AFM of Guanine Adsorbed on HOPG under Electrochemical Control
A.-M. Chiorcea, A.M. Oliveira Brett
29. Dynamics in Model Membranes and DNA-Membrane Complexes Using Temperature Controlled Atomic Force Microscopy
Z.V. Leonenko, D.T. Cramb
Keywords: Physics, Condensed Matter, Optical and Electronic Materials, Nanotechnology, Surfaces and Interfaces, Thin Films
- Author(s)
- Vilarinho, Paula Maria
- Rosenwaks, Yossi
- Kingon, Angus
- Publisher
- Springer
- Publication year
- 2005
- Language
- en
- Edition
- 1
- Series
- NATO Science Series II: Mathematics, Physics and Chemistry
- Page amount
- 525 pages
- Category
- Natural Sciences
- Format
- Ebook
- eISBN (PDF)
- 9781402030192