Levinshtein, Michael
Advanced Experimental Methods For Noise Research in Nanoscale Electronic Devices
I. Noise Sources
1. 1
F.N. Hooge
2. Noise Sources in GaN/AlGaN Quantum Wells and Devices
S. Rumyantsev
3. 1
M. N. Mihaila
4. 1
G. Härtler
5. Quantum Phase Locking, 1
M. Planat, H. Rosu
6. Shot Noise in Mesoscopic Devices and Quantum Dot Networks
M. Macucci, P. Marconcini, G. Iannaccone, M. Gattobigio, G. Basso, B. Pellegrini
7. Super-Poissonian Noise in Nanostructures
Ya. M. Blanter
8. Stochastic and Deterministic Models of Noise
J. Kumicák
II. Noise in Nanoscale Devices
9. Noise in Optoelectronic Devices
R. Alabedra
10. Fluctuations of Optical and Electrical Parameters and Their Correlation of Multiple-Quantum-Well INGAAS/INP Lasers
S. Pralgauskaite, V. Palenskis, J. Matukas
11. Microwave Noise and Fast/Ultrafast Electronic Processes in Nitride 2DEG Channels
A. Matulionis
12. Noise of High Temperature Superconducting Bolometers
I.A. Khrebtov
13. 1/
L.K.J. Vandamme
14. Experimental Assessment of Quantum Effects in the Low-Frequency Noise and RTS of Deep Submicron MOSFETs
E. Simoen, A. Mercha, C. Claeys
15. Noise and Tunneling Through the 2.5 nm Gate Oxide in Soi MOSFETs
N. Lukyanchikova, E. Simoen, A. Mercha, C. Claeys
16. Low Frequency Noise Studies of Si Nano-Crystal Effects in MOS Transistors and Capacitors
S. Ferraton, L. Montès, I. Ionica, J. Zimmermann, J. A. Chroboczek
17. Noise Modelling in Low Dimensional Electronic Structures
L. Reggiani, V. Ya Aleshkin, A. Reklaitis
18. Correlation Noise Measurements and Modeling of Nanoscale MOSFETs
J. Lee, G. Bosman
19. Tunneling Effects and Low Frequency Noise of GaN/GaAlN HFETs
M. Levinshtein, S. Rumyantsev, M. S. Shur
20. High Frequency Noise Sources Extraction in Nanometique MOSFETs
F. Danneville, G. Pailloncy, G. Dambrine
21. Iiformative “Passport Data” of Surface Nano- and Mocrostrucures
S. F. Timashev, A. B. Solovieva, G. V. Vstovsky
III. Noise Measurement Technique
22. Noise Measurement Technique
L.K.J. Vandamme
23. Techniques for High-Sensitivity Measurements of Shot Noise in Nanostructures
B. Pellegrini, G. Basso, M. Macucci
24. Correlation Spectrum Analyzer: Pringiples and Limits in Noise Measurements
G. Ferrari, M. Sampietro
25. Measurement and Analysis Methods for Random Telegraph Signals
Z. Çelik-Butler
26. RTS in Quantum Dots and MOSFETs: Experimental Set-Up with Long-Time Stability and Magnetic Field Compensation
J. Sikula, J. Pavelka, M. Tacano, S. Hashiguchi, M. Toita
27. Some Considerations for the Construction of Low-Noise Amplifiers in Very Low Frequency Region
J. Sikula, S. Hashiguchi, M. Ohki, M. Tacano
28. Measurements of Low Frequency Noise in Nano-Grained RuO
A. Kolek
29. Technique for Investigation of Non-Gaussian and Non-Stationary Properties of LF Noise in Nanoscale Semiconductor Devices
A. Yakimov, A. Belyakov, S. Medvedev, A. Moryashin, M. Perov
30. The Noise Background Suppression of Noise Measuring Set-UP
P. Hruska, K. Hajek
31. Accuracy of Noise Measurements for 1/
I. Slaidinš
32. Radiofrequency and Microwave Noise Metrology
E. Rubiola, V. Giordano
33. Treatment of Noise Data in Laplace Plane
B.M. Grafov
34. Measurement of Noise Parameter Set in the Low Frequency Range: Requirements and Instrumentation
L. Hasse
35. Techniques of Interference Reduction in Probe System for Wafer Level Noise Measurements of Submicron Semiconductor Devices
L. Spiralski, A. Szewczyk, L. Hasse
36. Hooge Mobility Fluctuations in
S. Durov, O.A. Mironov, M. Myronov, T.E. Whall, V.T. Igumenov, V.M. Konstantinov, V.V. Paramonov
37. Optimised Preamplifier for LF-Noise MOSFET Characterization
S. Durov, O.A. Mironov
38. Net of YBCO and LSMO Thermometers for Bolometric Applications
B. Guillet, L Méchin, F. Yang, J.M. Routoure, G. Dem, C. Gunther, D. Robbes, R.A. Chakalov
39. Diagnostics of GaAs Light Emitting Diode pn Junctions
P. Koktavy, B. Koktavy
40. New Tools For Fast And Senstive Noise Measurements
J. Sikula, M. Tacano, S. Yokokura, S. Hashiguchi
41. Using a Novel, Computer Controlled Automatic System for LF Noise Measurements Under Point Probes
J.A. Chroboczek, S. Ferraton, G. Piantino
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Keywords: SCIENCE / Physics SCI055000
- Author(s)
- Levinshtein, Michael
- Sikula, Josef
- Publisher
- Springer
- Publication year
- 2005
- Language
- en
- Edition
- 1
- Category
- Natural Sciences
- Format
- Ebook
- eISBN (PDF)
- 9781402021701