Gyvez, José Pineda de
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
1. Introduction
Manoj Sachdev, José Pineda de Gyvez
2. Functional and Parametric Defect Models
Manoj Sachdev, José Pineda de Gyvez
3. Digital CMOS Fault Modeling
Manoj Sachdev, José Pineda de Gyvez
4. Defects in Logic Circuits and their Test Implications
Manoj Sachdev, José Pineda de Gyvez
5. Testing Defects and Parametric Variations in RAMs
Manoj Sachdev, José Pineda de Gyvez
6. Defect-Oriented Analog Testing
Manoj Sachdev, José Pineda de Gyvez
7. Yield Engineering
Manoj Sachdev, José Pineda de Gyvez
8. Conclusion
Manoj Sachdev, José Pineda de Gyvez
DRM-restrictions
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- Author(s)
- Gyvez, José Pineda de
- Sachdev, Manoj
- Publisher
- Springer
- Publication year
- 2007
- Language
- en
- Edition
- 1
- Category
- Technology, Energy, Traffic
- Format
- Ebook
- eISBN (PDF)
- 9780387465470