Gruverman, Alexei
Scanning Probe Microscopy
1. Introduction
S. V. Kalinin, A. Gruverman
Part I. SPM Techniques for Electrical Characterization
2. Scanning Tunneling Potentiometry: The Power of STM applied to Electrical Transport
A. P. Baddorf
3. Probing Semiconductor Technology and Devices with Scanning Spreading Resistance Microscopy
P. Eyben, W. Vandervorst, D. Alvarez, M. Xu, M. Fouchier
4. Scanning Capacitance Microscopy for Electrical Characterization of Semiconductors and Dielectrics
J. J. Kopanski
5. Principles of Kelvin Probe Force Microscopy
Th. Glatzel, M.Ch. Lux-Steiner, E. Strassburg, A. Boag, Y. Rosenwaks
6. Frequency-Dependent Transport Imaging by Scanning Probe Microscopy
Ryan O’Hayre, Minhwan Lee, Fritz B. Prinz, Sergei V. Kalinin
7. Review of Ferroelectric Domain Imaging by Piezoresponse Force Microscopy
A. L. Kholkin, S. V. Kalinin, A. Roelofs, A. Gruverman
8. Principles of Near-Field Microwave Microscopy
Steven M. Anlage, Vladimir V. Talanov, Andrew R. Schwartz
9. Electromagnetic Singularities and Resonances in Near-Field Optical Probes
Alexandre Bouhelier, Renaud Bachelot
10. Electrochemical SPM
T. J. Smith, K. J. Stevenson
11. Near-Field High-Frequency Probing
C. A. Paulson, D. W. Weide
Part II. Electrical and Electromechanical Imaging at the Limits of Resolution
12. Scanning Probe Microscopy on Low-Dimensional Electron Systems in III–V Semiconductors
Markus Morgenstern
13. Spin-Polarized Scanning Tunneling Microscopy
Wulf Wulfhekel, Uta Schlickum, Jürgen Kirschner
14. Scanning Probe Measurements of Electron Transport in Molecules
Kevin F. Kelly, Paul S. Weiss
15. Scanning Probe Microscopy of Individual Carbon Nanotube Quantum Devices
C. Staii, M. Radosavljevic, A. T. Johnson
16. Conductance AFM Measurements of Transport Through Nanotubes and Nanotube Networks
M. Stadermann, S. Washburn
17. Theory of Scanning Probe Microscopy
Vincent Meunier, Philippe Lambin
18. Multi-Probe Scanning Tunneling Microscopy
Shuji Hasegawa
19. Dynamic Force Microscopy and Spectroscopy in Vacuum
Udo D. Schwarz, Hendrik Hölscher
20. Scanning Tunneling Microscopy and Spectroscopy of Manganites
Christoph Renner, Henrik M. Rønnow
Part III. Electrical SPM Characterization of Materials and Devices
21. Scanning Voltage Microscopy
Scott B. Kuntze, Dayan Ban, Edward H. Sargent, St. John Dixon-Warren, J. Kenton White, Karin Hinzer
22. Electrical Scanning Probe Microscopy of Biomolecules on Surfaces and at Interfaces
Ida Lee, Elias Greenbaum
23. Electromechanical Behavior in Biological Systems at the Nanoscale
Alexei Gruverman, Brian J. Rodriguez, Sergei V. Kalinin
24. Scanning Capacitance Microscopy
C. Y. Nakakura, P. Tangyunyong, M. L. Anderson
25. Kelvin Probe Force Microscopy of Semiconductors
Y. Rosenwaks, S. Saraf, O. Tal, A. Schwarzman, Th. Glatzel, M. Ch. Lux-Steiner
26. Nanoscale Characterization of Electronic and Electrical Properties of III-Nitrides by Scanning Probe Microscopy
B. J. Rodriguez, A. Gruverman, R. J. Nemanich
27. Electron Flow Through Molecular Structures
Sidney R. Cohen
28. Electrical Characterization of Perovskite Nanostructures by SPM
K. Szot, B. Reichenberg, F. Peter, R. Waser, S. Tiedke
29. SPM Measurements of Electric Properties of Organic Molecules
Takao Ishida, Wataru Mizutani, Yasuhisa Naitoh, Hiroshi Tokumoto
30. High-Sensitivity Electric Force Microscopy of Organic Electronic Materials and Devices
William R. Silveira, Erik M. Muller, Tse Nga Ng, David Dunlap, John A. Marohn
Part IV. Electrical Nanofabrication
31. Electrical SPM-Based Nanofabrication Techniques
Nicola Naujoks, Patrick Mesquida, Andreas Stemmer
32. Fundamental Science and Lithographic Applications of Scanning Probe Oxidation
J. A. Dagata
33. UHV-STM Nanofabrication on Silicon
Peter M. Albrecht, Laura B. Ruppalt, Joseph W. Lyding
34. Ferroelectric Lithography
Dongbo Li, Dawn A. Bonnell
35. Patterned Self-Assembled Monolayers via Scanning Probe Lithography
James A. Williams, Matthew S. Lewis, Christopher B. Gorman
36. Resistive Probe Storage: Read/Write Mechanism
Seungbum Hong, Noyeol Park
Keywords: Chemistry, Characterization and Evaluation of Materials, Nanotechnology, Surfaces and Interfaces, Thin Films, Biological Microscopy, Mechanical Engineering, Solid State Physics and Spectroscopy
- Author(s)
- Gruverman, Alexei
- Kalinin, Sergei
- Publisher
- Springer
- Publication year
- 2007
- Language
- en
- Edition
- 1
- Page amount
- 1000 pages
- Category
- Natural Sciences
- Format
- Ebook
- eISBN (PDF)
- 9780387286686