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Huisman, Leendert M.

Data Mining and Diagnosing IC Fails

Data Mining and Diagnosing IC Fails

136,40€

PDF with Adobe DRM
ISBN: 9780387263519
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Table of contents

1. Introduction
2. Statistics
3. Yield Statistics
4. Area Dependence of the Yield
5. Statistics of Embedded Object Fails
6. Fail Commonalities
7. Spatial Patterns
8. Test Coverage and Test Fallout
9. Logic Diagnosis
10. SLAT based Diagnosis
11. Data Collection Requirements

DRM-restrictions

Printing: not available
Clipboard copying: not available

Keywords: TECHNOLOGY & ENGINEERING / General TEC000000

Author(s)
Publisher
Springer
Publication year
2005
Language
en
Edition
1
Category
Technology, Energy, Traffic
Format
Ebook
eISBN (PDF)
9780387263519

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