Huisman, Leendert M.
Data Mining and Diagnosing IC Fails
Table of contents
1. Introduction
2. Statistics
3. Yield Statistics
4. Area Dependence of the Yield
5. Statistics of Embedded Object Fails
6. Fail Commonalities
7. Spatial Patterns
8. Test Coverage and Test Fallout
9. Logic Diagnosis
10. SLAT based Diagnosis
11. Data Collection Requirements
DRM-restrictions
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- Author(s)
- Huisman, Leendert M.
- Publisher
- Springer
- Publication year
- 2005
- Language
- en
- Edition
- 1
- Category
- Technology, Energy, Traffic
- Format
- Ebook
- eISBN (PDF)
- 9780387263519