Croon, Jeroen A.
Matching Properties of Deep Sub-Micron MOS Transistors
Table of contents
1. Introduction
2. Measurement and Modeling of Mismatch in the Drain Current
3. Parameter Extraction
4. Physical Origins of Mosfet Mismatch
5. Technological Aspects
6. Impact of Line-Edge Roughness on Parameter Fluctuations, Off-State Current and Yield
7. Conclusions, Future Work and Outlook
DRM-restrictions
Printing: not available
Clipboard copying: not available
- Author(s)
- Croon, Jeroen A.
- Maes, Herman E.
- Sansen, Willy
- Publisher
- Springer
- Publication year
- 2005
- Language
- en
- Edition
- 1
- Category
- Technology, Energy, Traffic
- Format
- Ebook
- eISBN (PDF)
- 9780387243139
